[IEEE Proceedings of International Reliability Physics Symposium - Dallas, TX, USA (1996.04.30-1996.05.2)] Proceedings of International Reliability Physics Symposium RELPHY-96 - Unified model for n-channel hot-carrier degradation under different degradation mechanisms
Pagey, M., Milanowski, R., Snyder, E., Bui, N., Deem, B., Bhuva, B., Kerns, S.Year:
1996
Language:
english
DOI:
10.1109/relphy.1996.492132
File:
PDF, 470 KB
english, 1996