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[IEEE Proceedings of IEEE Bipolar/BiCMOS Circuits and Technology Meeting BIPOL-93 - Minneapolis, MN, USA (1994.10.10-1994.10.11)] Proceedings of IEEE Bipolar/BiCMOS Circuits and Technology Meeting BIPOL-93 - Effects of interfacial oxide on hot carrier reliability of polysilicon emitter npn transistors
Reuss,, Varker,, Bunevich,Year:
1993
Language:
english
DOI:
10.1109/bipol.1993.617502
File:
PDF, 465 KB
english, 1993