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[IEEE 2007 IEEE International Workshop on Memory Technology, Design and Testing (MTDT) - Taipei, Taiwan (2007.12.3-2007.12.5)] 2007 IEEE International Workshop on Memory Technology, Design and Testing - Logic-compatible embedded NVM for RFID application

Kuo, C.H., Wang, J.C., Yu-Der Chih,, Wang, James, Yew, T.Y., Der-Shin Shyu,, Huang, Jim, Liu, Kyle
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Year:
2007
Language:
english
DOI:
10.1109/mtdt.2007.4547621
File:
PDF, 395 KB
english, 2007
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