In Situ Surface X-Ray Diffraction Studies of the Influence...

In Situ Surface X-Ray Diffraction Studies of the Influence of the PEG-Cl-Complex on Homoepitaxial Electrodeposition on Cu(001)

Golks, F., Grunder, Y., Drunkler, A., Roy, J., Stettner, J., Zegenhagen, J., Magnussen, O. M.
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Volume:
160
Language:
english
Journal:
Journal of the Electrochemical Society
DOI:
10.1149/2.027312jes
Date:
October, 2013
File:
PDF, 992 KB
english, 2013
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