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[IEEE International Conference on Actual Problems of Electron Devices Engineering, 2004. APEDE 2004. - Saratov (15-16 Sept. 2004)] International Conference on Actual Problems of Electron Devices Engineering, 2004. APEDE 2004. - The directions of the practical use the models of the test tasks, formed on base binomial theorum

Zaharov, A.A., Kashirin, E.G.
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Year:
2004
DOI:
10.1109/apede.2004.1393600
File:
PDF, 175 KB
2004
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