[IEEE 2012 International Conference on Advanced...

  • Main
  • [IEEE 2012 International Conference on...

[IEEE 2012 International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM) - Smolenice, Slovakia (2012.11.11-2012.11.15)] The Ninth International Conference on Advanced Semiconductor Devices and Mircosystems - Detector of fast neutrons based on silicon carbide epitaxial layers

Zat'ko, B., Dubecky, F., Sagatova, A., Sedlackova, K., Bohacek, P., Sekacova, M., Necas, V.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2012
Language:
english
DOI:
10.1109/asdam.2012.6418580
File:
PDF, 130 KB
english, 2012
Conversion to is in progress
Conversion to is failed