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[IEEE 2012 International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM) - Smolenice, Slovakia (2012.11.11-2012.11.15)] The Ninth International Conference on Advanced Semiconductor Devices and Mircosystems - Detector of fast neutrons based on silicon carbide epitaxial layers
Zat'ko, B., Dubecky, F., Sagatova, A., Sedlackova, K., Bohacek, P., Sekacova, M., Necas, V.Year:
2012
Language:
english
DOI:
10.1109/asdam.2012.6418580
File:
PDF, 130 KB
english, 2012