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Improvement of Memory State Misidentification Caused by Trap-Assisted GIDL Current in a SONOS-TFT Memory Device
Te-Chih Chen,, Ting-Chang Chang,, Fu-Yen Jian,, Shih-Ching Chen,, Chia-Sheng Lin,, Ming-Hsien Lee,, Jim-Shone Chen,, Ching-Chieh Shih,Volume:
30
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2009.2023827
Date:
August, 2009
File:
PDF, 334 KB
english, 2009