![](/img/cover-not-exists.png)
[IEEE 2010 IEEE International Integrated Reliability Workshop (IIRW) - S. Lake Tahoe, CA, USA (2010.10.17-2010.10.21)] 2010 IEEE International Integrated Reliability Workshop Final Report - Qualification of 128 Gb MLC NAND Flash for SMAP space mission
Heidecker, Jason, White, Mark, Cooper, Mark, Sheldon, Douglas, Irom, Farokh, Nguyen, DucYear:
2010
Language:
english
DOI:
10.1109/iirw.2010.5706510
File:
PDF, 339 KB
english, 2010