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[IEEE 2009 1st Asia Symposium on Quality Electronic Design (ASQED 2009) - Kuala Lumpur, Malaysia (2009.07.15-2009.07.16)] 2009 1st Asia Symposium on Quality Electronic Design - Analytical modeling of Hot Carrier Injection induced degradation in triple gate bulk FinFETs
Ghobadi, Nayereh, Afzali-Kusha, Ali, Asl-Soleimani, EbrahimYear:
2009
Language:
english
DOI:
10.1109/asqed.2009.5206302
File:
PDF, 457 KB
english, 2009