Role of E-E scattering in the enhancement of channel hot...

IEEE Transactions on Device and Materials Reliability 2001 / 6 Vol. 1; Iss. 2

Role of E-E scattering in the enhancement of channel hot carrier degradation of deep-submicron NMOSFETs at high V/sub GS/ conditions

Rauch, S.E., La Rosa, G., Guarin, F.J.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
1
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/7298.956705
Date:
June, 2001
File:
PDF, 201 KB
english, 2001
Conversion to is in progress
Conversion to is failed