![](/img/cover-not-exists.png)
[IEEE 2012 35th International Spring Seminar on Electronics Technology (ISSE) - Bad Aussee, Austria (2012.05.9-2012.05.13)] 2012 35th International Spring Seminar on Electronics Technology - Reliability testing of lead-free solder joints
Bazu, Marius, Ilian, Virgil Emil, Galateanu, Lucian, Varsescu, Dragos, Pietrikova, AlenaYear:
2012
Language:
english
DOI:
10.1109/isse.2012.6273133
File:
PDF, 304 KB
english, 2012