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[IEEE Design, Automation & Test in Europe Conference - Nice, France (2007.04.16-2007.04.20)] 2007 Design, Automation & Test in Europe Conference & Exhibition - Microprocessors in the Era of Terascale Integration
Borkar, Shekhar, Jouppi, Norman P., Stenstrom, PerYear:
2007
Language:
english
DOI:
10.1109/date.2007.364597
File:
PDF, 115 KB
english, 2007