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[IEEE 2007 IEEE International Electron Devices Meeting - Washington, DC, USA (2007.12.10-2007.12.12)] 2007 IEEE International Electron Devices Meeting - A review of failure modes and mechanisms of GaN-based HEMTs
Zanoni, Enrico, Meneghesso, Gaudenzio, Verzellesi, Giovanni, Danesin, Francesca, Meneghini, Matteo, Rampazzo, Fabiana, Tazzoli, Augusto, Zanon, FrancoYear:
2007
Language:
english
DOI:
10.1109/iedm.2007.4418952
File:
PDF, 2.47 MB
english, 2007