Latent effects due to ESD in CMOS integrated circuits:...

IEEE Transactions on Industry Applications 1993 / Jan.-Feb. Vol. 29; Iss. 1

Latent effects due to ESD in CMOS integrated circuits: review and experiments

Greason, W.D., Kucerovsky, Z., Chum, K.W.K.
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Volume:
29
Language:
english
Journal:
IEEE Transactions on Industry Applications
DOI:
10.1109/28.195893
Date:
January, 1993
File:
PDF, 1.02 MB
english, 1993
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