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Latent effects due to ESD in CMOS integrated circuits: review and experiments
Greason, W.D., Kucerovsky, Z., Chum, K.W.K.Volume:
29
Language:
english
Journal:
IEEE Transactions on Industry Applications
DOI:
10.1109/28.195893
Date:
January, 1993
File:
PDF, 1.02 MB
english, 1993