[IEEE Technical Digest., International Electron Devices Meeting - San Francisco, CA, USA (11-14 Dec. 1988)] Technical Digest., International Electron Devices Meeting - Constraints in p-channel device engineering for submicron CMOS technologies
Chen, M., Cochran, W.T., Yang, T.S., Dziuba, C., Leung, C., Lin, W., Jungling, W.Year:
1988
DOI:
10.1109/iedm.1988.32838
File:
PDF, 273 KB
1988