[IEEE 2007 IEEE International Electron Devices Meeting - Washington, DC, USA (2007.12.10-2007.12.12)] 2007 IEEE International Electron Devices Meeting - A New Self-Aligned Nitride MTP Cell with 45nm CMOS Fully Compatible Process
Huang, Chia-En, Chen, Hsin-Ming, Lai, Han-Chao, Chen, Ying-Je, King, Ya-Chin, Lin, Chrong JungYear:
2007
Language:
english
DOI:
10.1109/iedm.2007.4418871
File:
PDF, 3.53 MB
english, 2007