[IEEE 2010 IEEE Symposium on Industrial Electronics and Applications (ISIEA 2010) - Penang, Malaysia (2010.10.3-2010.10.5)] 2010 IEEE Symposium on Industrial Electronics and Applications (ISIEA) - Scalable test pattern generation (STPG)
Yiunn, Dennis Bong Yuan, Bin A'ain, Abu Khari, Khor,, Ghee, JeenYear:
2010
Language:
english
DOI:
10.1109/isiea.2010.5679428
File:
PDF, 334 KB
english, 2010