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[IEEE 2010 IEEE Symposium on Industrial Electronics and Applications (ISIEA 2010) - Penang, Malaysia (2010.10.3-2010.10.5)] 2010 IEEE Symposium on Industrial Electronics and Applications (ISIEA) - Scalable test pattern generation (STPG)

Yiunn, Dennis Bong Yuan, Bin A'ain, Abu Khari, Khor,, Ghee, Jeen
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Year:
2010
Language:
english
DOI:
10.1109/isiea.2010.5679428
File:
PDF, 334 KB
english, 2010
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