[IEEE 2011 6th International Microsystems, Packaging,...

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[IEEE 2011 6th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT) - Taipei, Taiwan (2011.10.19-2011.10.21)] 2011 6th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT) - Thermal characterization of a wide I/O 3DIC

Tsai, Kuo-ying, Ku, Shih-chang, Chang, Wen-yuan, Tsai, Hong-jie
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Year:
2011
Language:
english
DOI:
10.1109/impact.2011.6117256
File:
PDF, 886 KB
english, 2011
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