[IEEE 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - San Jose, CA, USA (April 17-21, 2005)] 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - Novel soft erase and re-fill methods for a P/sup +/-poly gate nitride trapping non-volatile memory device with excellent endurance and retention properties

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