Characteristics of transmission lines fabricated by CMOS...

IEEE Transactions on Microwave Theory and Techniques 2006 / 02 Vol. 54; Iss. 2

Characteristics of transmission lines fabricated by CMOS process with deep n-well implantation

Nishikawa, K., Shintani, K., Yamakawa, S.
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Volume:
54
Language:
english
Journal:
IEEE Transactions on Microwave Theory and Techniques
DOI:
10.1109/tmtt.2005.862679
Date:
February, 2006
File:
PDF, 474 KB
english, 2006
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