[IEEE 2007 IEEE International SOI Conference - Indian Wells, CA, USA (2007.10.1-2007.10.4)] 2007 IEEE International SOI Conference - Thermal Effects of Three Dimensional Integrated Circuit Stacks
Chen, C.L., Chen, C.K., Burns, J.A., Yost, D-R, Warner, K., Knecht, J.M., Wyatt, P.W., Shibles, D.A., Keast, C.L.Year:
2007
Language:
english
DOI:
10.1109/soi.2007.4357867
File:
PDF, 1.00 MB
english, 2007