[IEEE 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012) - Singapore, Singapore (2012.07.2-2012.07.6)] 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Capacitor dendrite failure analysis for lidless CPU testing
Weidong, Huang, Changhong, Yu, Cimi, Cui, Dolphin, Zuo, Hongwei, Guo, Chris, Xie, Majed, AnaniYear:
2012
Language:
english
DOI:
10.1109/ipfa.2012.6306253
File:
PDF, 1.04 MB
english, 2012