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[IEEE Conference Record AUTOTESTCON '95. 'Systems Readiness: Test Technology for the 21st Century' - Atlanta, GA, USA (8-10 Aug. 1995)] Conference Record AUTOTESTCON '95. 'Systems Readiness: Test Technology for the 21st Century' - Correspondence between VXI plug&play specifications and ABBET standards
Cashar, E.E., Sacher, E.Year:
1995
Language:
english
DOI:
10.1109/autest.1995.522654
File:
PDF, 264 KB
english, 1995