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[IEEE Tenth IEEE International High-Level Design Validation and Test Workshop, 2005. - Napa Valley, CA, USA (Nov. 30-Dec. 2, 2005)] Tenth IEEE International High-Level Design Validation and Test Workshop, 2005. - Functional coverage - is your design exposed?
Piziali, A., Ziv, A.Year:
2005
Language:
english
DOI:
10.1109/hldvt.2005.1568845
File:
PDF, 116 KB
english, 2005