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[IEEE 2012 21st Asian Test Symposium (ATS) - Niigata, Japan (2012.11.19-2012.11.22)] 2012 IEEE 21st Asian Test Symposium - LBIST/ATPG Technologies for On-Demand Digital Logic Testing in Automotive Circuits
Meehl, Dale, Petrakis, Bassilios, Zhang, PingYear:
2012
Language:
english
DOI:
10.1109/ats.2012.24
File:
PDF, 203 KB
english, 2012