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[IEEE Comput. Soc. Press ISSRE '96: 7th International Symposium on Software Reliability Engineering - White Plains, NY, USA (30 Oct.-2 Nov. 1996)] Proceedings of ISSRE '96: 7th International Symposium on Software Reliability Engineering - Sensitivity of reliability growth models to operational profile errors
Crespo, A.N., Matrella, P., Pasquini, A.Year:
1996
Language:
english
DOI:
10.1109/issre.1996.558688
File:
PDF, 723 KB
english, 1996