[IEEE Comput. Soc 20th IEEE VLSI Test Symposium (VTS 2002) - Monterey, CA, USA (28 April-2 May 2002)] Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) - Test economics for multi-site test with modern cost reduction techniques
Volkerink, E.H., Khoche, A., Rivoir, J., Hilliges, K.D.Year:
2002
Language:
english
DOI:
10.1109/vts.2002.1011173
File:
PDF, 294 KB
english, 2002