![](/img/cover-not-exists.png)
[IEEE Digest of Technical Papers. 2005 Symposium on VLSI Circuits, 2005. - Kyoto, Japan (June 16-18, 2005)] Digest of Technical Papers. 2005 Symposium on VLSI Circuits, 2005. - Modeling and experimental verification of substrate coupling and isolation techniques in mixed-signal ICs on a lightly-doped substrate
Van der Plas, G., Soens, C., Badaroglu, M., Wambacq, P., Donnay, S.Year:
2005
DOI:
10.1109/vlsic.2005.1469386
File:
PDF, 613 KB
2005