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[Widerkehr and Associates 2004 Symposium on VLSI Circuits. Digest of Technical Papers - Honolulu, HI, USA (17-19 June 2004)] 2004 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.04CH37525) - Impact of body bias on alpha- and neutron-induced soft error rates of flip-flops
Karnik, T., Tschanz, J., Bloechel, B., Hazucha, P., Armstrong, P., Narendra, S., Keshavarzi, A., Soumyanath, K., Dermer, G., Maiz, J., Borkar, S., De, V.Year:
2004
Language:
english
DOI:
10.1109/vlsic.2004.1346603
File:
PDF, 178 KB
english, 2004