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[IEEE 2011 International Conference on Biometrics and Kansei Engineering (ICBAKE) - Takamatsu, Japan (2011.09.19-2011.09.22)] 2011 International Conference on Biometrics and Kansei Engineering - Child-Care Training System to Improve Quality of Child-Care
Fujiwara, Tomohiro, Yoshizaki, Tomonori, Nagata, Ken, Kaneda, Shigeo, Shimohara, KatsunoriYear:
2011
Language:
english
DOI:
10.1109/icbake.2011.31
File:
PDF, 351 KB
english, 2011