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[IEEE 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Austin, TX, USA (2012.10.3-2012.10.5)] 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Minimization of Trojan footprint by reducing Delay/Area impact
Rahmatian, Mehryar, Kooti, Hessam, Harris, Ian G., Bozorgzadeh, ElahehYear:
2012
DOI:
10.1109/dft.2012.6378200
File:
PDF, 488 KB
2012