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[IEEE 2010 Fifth IEEE International Workshop on Systematic Approaches to Digital Forensic Engineering - Oakland, CA, USA (2010.05.20-2010.05.20)] 2010 Fifth IEEE International Workshop on Systematic Approaches to Digital Forensic Engineering - Digital Forensics and Crime Investigation: Legal Issues in Prosecution at National Level
Khan, Ayaz, Wiil, Uffe Kock, Memon, NasrullahYear:
2010
Language:
english
DOI:
10.1109/sadfe.2010.8
File:
PDF, 379 KB
english, 2010