[IEEE 2013 IEEE International Conference of Electron...

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[IEEE 2013 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Hong Kong, Hong Kong (2013.06.3-2013.06.5)] 2013 IEEE International Conference of Electron Devices and Solid-state Circuits - A nano-power switched-capacitor voltage reference using body effect in MOSFETs for application in subthreshold LSI

Hao Zhang,, Mengshu Huang,, Yimeng Zhang,, Xutao Li,, Yoshihara, Tsutomu
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Year:
2013
Language:
english
DOI:
10.1109/edssc.2013.6628130
File:
PDF, 664 KB
english, 2013
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