Investigation of One-Dimensional Thickness Scaling on $...

IEEE Electron Device Letters 2012 / 11 Vol. 33; Iss. 11

Investigation of One-Dimensional Thickness Scaling on $ \hbox{Cu/HfO}_{x}/\hbox{Pt}$ Resistive Switching Device Performance

Wang, Ming, Lv, Hangbing, Liu, Qi, Li, Yingtao, Xu, Zhongguang, Long, Shibing, Xie, Hongwei, Zhang, Kangwei, Liu, Xiaoyu, Sun, Haitao, Yang, Xiaoyi, Liu, Ming
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Volume:
33
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2012.2211563
Date:
November, 2012
File:
PDF, 485 KB
english, 2012
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