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[IEEE 2010 23rd Annual Meeting of the IEEE Photonics Society (Formerly LEOS Annual Meeting) - Denver, CO, USA (2010.11.7-2010.11.11)] 2010 IEEE Photinic Society's 23rd Annual Meeting - Characterization of InGaAs/InP single-photon avalanche diodes
Tosi, Alberto, Acerbi, Fabio, Dalla Mora, Alberto, Zappa, FrancoYear:
2010
Language:
english
DOI:
10.1109/photonics.2010.5698792
File:
PDF, 2.42 MB
english, 2010