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[IEEE 2013 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2013.09.6-2013.09.13)] 2013 IEEE International Test Conference (ITC) - Counterfeit electronics: A rising threat in the semiconductor manufacturing industry

Huang, Ke, Carulli, John M., Makris, Yiorgos
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Year:
2013
Language:
english
DOI:
10.1109/test.2013.6651880
File:
PDF, 1.36 MB
english, 2013
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