[IEEE 2006 IEEE Nanotechnology Materials and Devices...

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[IEEE 2006 IEEE Nanotechnology Materials and Devices Conference - Gyeongju, South Korea (2006.10.22-2006.10.25)] 2006 IEEE Nanotechnology Materials and Devices Conference - Study on tunneling current through barrier height using scanning tunneling microscopy

Nam-Suk Lee,, Dong-Jin Qian,, Hoon-Kyu Shin,, Young-Soo Kwon,
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Year:
2006
Language:
english
DOI:
10.1109/nmdc.2006.4388907
File:
PDF, 426 KB
english, 2006
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