[IEEE 2006 IEEE Nanotechnology Materials and Devices Conference - Gyeongju, South Korea (2006.10.22-2006.10.25)] 2006 IEEE Nanotechnology Materials and Devices Conference - Study on tunneling current through barrier height using scanning tunneling microscopy
Nam-Suk Lee,, Dong-Jin Qian,, Hoon-Kyu Shin,, Young-Soo Kwon,Year:
2006
Language:
english
DOI:
10.1109/nmdc.2006.4388907
File:
PDF, 426 KB
english, 2006