[IEEE 2000 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (23-26 Oct. 2000)] 2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515) - A probabilistic-physics-of-failure/short-time-test approach to reliability assurance for high-performance chips: models for deep-submicron transistors and optical interconnects

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