[IEEE Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 - Taiwan (5-8 July 2004)] Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) - TRE signal processing by positive photon discrimination
Desplats, R., Faggion, G., Remmach, M., Beaudoin, F., Perdu, P.Year:
2004
Language:
english
DOI:
10.1109/ipfa.2004.1345619
File:
PDF, 245 KB
english, 2004