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[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - Dark current reduction in very-large area CCD imagers for professional DSC applications
Inge M. Peters, Agnes KleimannYear:
2004
Language:
english
DOI:
10.1109/iedm.2004.1419355
File:
PDF, 210 KB
english, 2004