[IEEE 2011 Sixth International Conference on Availability, Reliability and Security (ARES) - Vienna, Austria (2011.08.22-2011.08.26)] 2011 Sixth International Conference on Availability, Reliability and Security - A Gate Level Analysis of Transient Faults Effects on Dual-Core Chip-Multi Processors
Didehban, Moslem, Sadafi, Ario, Salehi, Sajjad, Chami, Mohammad BagherYear:
2011
Language:
english
DOI:
10.1109/ares.2011.61
File:
PDF, 282 KB
english, 2011