[IEEE IEEE Radiation Effects Data Workshop, 2005. - Seattle, WA, USA (11-15 July 2005)] IEEE Radiation Effects Data Workshop, 2005. - Total ionizing dose effects in bipolar and BiCMOS devices
Chavez, R.M., Rax, B.G., Scheick, L.Z., Johnston, A.H.Year:
2005
Language:
english
DOI:
10.1109/redw.2005.1532681
File:
PDF, 370 KB
english, 2005