[IEEE IEEE Radiation Effects Data Workshop, 2005. -...

  • Main
  • [IEEE IEEE Radiation Effects Data...

[IEEE IEEE Radiation Effects Data Workshop, 2005. - Seattle, WA, USA (11-15 July 2005)] IEEE Radiation Effects Data Workshop, 2005. - Total ionizing dose effects in bipolar and BiCMOS devices

Chavez, R.M., Rax, B.G., Scheick, L.Z., Johnston, A.H.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2005
Language:
english
DOI:
10.1109/redw.2005.1532681
File:
PDF, 370 KB
english, 2005
Conversion to is in progress
Conversion to is failed