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[IEEE ICMTS 2005. 2005 International Conference on Microelectronic Test Structures - Leuven, Belgium (4-7 April 2005)] Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. - A simple and accurate capacitance ratio measurement technique for integrated circuit capacitor arrays
Zhenqiu Ning,, De Schepper, L., Delecourt, H.-X., Gillon, R., Tack, M.Year:
2005
Language:
english
DOI:
10.1109/icmts.2005.1452251
File:
PDF, 852 KB
english, 2005