Probability Level Dependence of Failure Mechanisms in Sub-20 nm NAND Flash Memory
Kang, Duckseoung, Lee, Kyunghwan, Kang, Myounggon, Seo, Seongjun, Li, Dong Hua, Hwang, Yuchul, Shin, HyungcheolVolume:
35
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2014.2301164
Date:
March, 2014
File:
PDF, 2.53 MB
english, 2014