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[IEEE 2006 IEEE Sarnoff Symposium - Princeton, NJ (2006.03.27-2006.03.28)] 2006 IEEE Sarnoff Symposium - An Efficient and Accurate Approach for Characterizing Non-Linear Capacitance in MESFET/HEMT Devices
Henriquez, Stanley L., Karangu, Caroline, Ogunniyi, Aderinto J., White, CarlYear:
2006
Language:
english
DOI:
10.1109/sarnof.2006.4534775
File:
PDF, 1.26 MB
english, 2006