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[IEEE 2006 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'06) - Taipei, Taiwan (02-04 Aug. 2006)] 2006 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'06) - Improved Representatives for Unrepairability Judging and Economic Repair Solutions of Memories
Hsing-Chung Liang,, Le-Quen Tzeng,Year:
2006
Language:
english
DOI:
10.1109/mtdt.2006.18
File:
PDF, 221 KB
english, 2006