[IEEE 2007 IEEE International Integrated Reliability...

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[IEEE 2007 IEEE International Integrated Reliability Workshop Final Report - South Lake Tahoe, CA, USA (2007.10.15-2007.10.18)] 2007 IEEE International Integrated Reliability Workshop Final Report - A new smart Vth-extraction methodology considering recovery and mobility degradation due to NBTI

Schlunder, Christian, Hoffmann, Marcel, Vollertsen, Rolf-Peter, Schindler, Gunther, Heinrigs, Wolfgang, Gustin, Wolfgang, Reisinger, Hans
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Year:
2007
Language:
english
DOI:
10.1109/irws.2007.4469211
File:
PDF, 229 KB
english, 2007
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