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[IEEE 2004 Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Grapevine, TX, USA (2004.09.19-2004.09.23)] 2004 Electrical Overstress/Electrostatic Discharge Symposium - Electrostatic field limits and charge threshold for field induced damage to voltage susceptible devices
Paasi, Jaakko, Salmela, Hannu, Smallwood, JeremyYear:
2004
Language:
english
DOI:
10.1109/eosesd.2004.5272605
File:
PDF, 205 KB
english, 2004