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[IEEE 24th IEEE VLSI Test Symposium - Berkeley, CA, USA (30-04 April 2006)] 24th IEEE VLSI Test Symposium - Scan Tests with Multiple Fault Activation Cycles for Delay Faults
Zhuo Zhang,, Reddy, S.M., Pomeranz, I., Xijiang Lin,, Rajski, J.Year:
2006
Language:
english
DOI:
10.1109/vts.2006.91
File:
PDF, 291 KB
english, 2006