[IEEE IEEE InternationalElectron Devices Meeting, 2005....

Main
[IEEE IEEE InternationalElectron...

[IEEE IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Tempe, Arizon, USA (Dec. 5, 2005)] IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - An advanced low power, high performance, strained channel 65nm technology

Tyagi, S., Auth, C., Bai, P., Curello, G., Deshpande, H., Gannavaram, S., Golonzka, O., Heussner, R., James, R., Kenyon, C., Lee, S.-H., Lindert, N., Liu, M., Nagisetty, R., Natarajan, S., Parker, C.,

How much do you like this book?

What’s the quality of the file?

Download the book for quality assessment

What’s the quality of the downloaded files?

Year:

2005

Language:

english

DOI:

10.1109/iedm.2005.1609318

File:

PDF, 1.30 MB

english, 2005

Conversion to is in progress

Conversion to is failed